First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Nanomechanical systems have now reached a level of precision and miniaturization that will allow them to be used in ultra-high-resolution atomic force microscopes in the future. (Nanowerk News) ...

A new electron spin resonance-atomic force microscopy setup enables single-spin quantum control on nonconductive samples.

The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...

For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical properties at the nanoscale—beyond what is visible to the naked eye—are essential.

Doing it yourself may not get you the most precise lab equipment in the world, but it gets you a hands-on appreciation of the techniques that just can’t be beat. Today’s example of this adage: [Stoppi ...

In MFM, a magnetic-coated AFM probe interacts with magnetic field gradients from the sample, causing detectable forces on the probe's cantilever. To focus on magnetic interactions, MFM is often ...